Atomic Force Microscopy, Scanning Tunneling Microscopy, Scanning Microwave Microscopy, Nanoscale Metrology
Using short-range interactions between a probe being scanned and a sample, it is possible to investigate materials at nanometric and even atomic range; investigation can be not only qualitative, e.g. imaging, but also quantitative, producing maps of electric/magnetic field intensity, of mechanical properties (e.g. local Young modulus) or electromagnetic properties such as conductivity of permittivity. New techniques, such as the near-field microwave microscopy, along with novel calibration techniques that allow to move from qualitative to quantitative are developed; at the same time the research is about the use of those techniques to experimentally investigate the realm of materials at nanoscale. Materials of interest include 2D novel compounds as well as biological sample, where measurements in physiological conditions are an almost completely unexplored research area.
Cornell University (NY, USA), Lehigh University (PA, USA), École de Technologie Supérieure (Canada), Johannes Kepler University (Austria),Università G. D’Annunzio (Italy).