Research Area

  • Title:
    Statistical Modeling and Simulation of Integrated Circuits and Micro- and Nano-Electronics Devices

  • Keywords:

    Statistical design, parametric yield, mismatch, nanodevices characterization, organic electron devices

  • Description:
  • This research aims to develop:
    • statistical device modeling useful in technology optimization
    • some methodologies for the statistical design flow of Integrated Circuits subject to statistical technological tolerances with particular attention to device mismatch.
    The main qualifying points of this research are:
    1. Experimental CMOS process characterization and statistical modeling
    2. Statistical circuits simulations and yield optimization for IC statistical design
    3. Characterization and statistical modeling of electronic devices based on low-dimensionality (1D, 2D) nanomaterials (carbon nanotubes, graphene, MoS2 and other dicalcogenides materials).
  • Laboratory:

    Micro- and Nano- Electronic Systems Characterization Lab

  • Contact Person:

    Paolo Crippa

  • Projects:

    (2019 – 2023) H2020 EU Project European Project funded by Horizon 2020 – Research and Innovation Framework Programme (activity: ICT-07-2018-RIA, proposal number: 825430) entitled “NANOSMART – NANO components for electronic SMART wireless systems’’,